Diffusion sampling method improves low-overlap X-ray ptychography
Original title: Progressive Coupling Method for Diffusion Posterior Sampling in Ptychography
Authors say progressive coupling beats iterative methods and other diffusion samplers when scan overlap is reduced.
The paper proposes progressive coupling posterior sampling so diffusion priors can reconstruct samples from fewer overlapping diffraction measurements. The sampler explores more of the solution space under high uncertainty, then tightens diffusion-guided consistency as the reconstruction refines. On real X-ray ptychographic data, the authors report better accuracy than traditional iterative methods and existing diffusion posterior samplers, especially at low overlaps.
Unconfirmed: Reconstruction gains are reported by the authors and are not independently verified here.
- PCPS is intended to offset weaker constraints when scan overlap is reduced.
- Authors compare it with iterative methods and existing diffusion posterior samplers.
- Reported gains are consistent and largest at low overlaps.
- Experiments use real X-ray ptychographic measurements.
From the original article
1 min read at arxiv.orgPtychography is a computational imaging method that reconstructs a sample from overlapping diffraction measurements. This technique relies on these overlapping measurements to provide the redundancy information needed for robust reconstruction, but dense scanning increases acquisition time and data volume.
By Yihan Qiu · arxiv.org
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