Quantifying IIoT Sensor Node Criticality by Fusing its Data Criticality and Security Vulnerability
Researchers propose a Dempster–Shafer framework fusing IIoT sensor data criticality with CVSS 4.0/3.1 vulnerability scores to rank node criticality.
The paper introduces a framework that evaluates Industrial IoT sensor node criticality by fusing data criticality and cybersecurity vulnerability scores using Dempster–Shafer (D-S) theory. It was validated on a dataset from red wine production and is claimed to generalize to other industrial settings with minimal modification. Results show criticality rankings derived from CVSS 4.0 scores differ significantly from those derived from CVSS 3.1, underscoring how vulnerability scoring methodology affects security prioritization.
- Fuses data criticality and CVSS vulnerability scores using Dempster–Shafer theory
- Validated on red wine production sensor dataset
- CVSS 4.0 rankings differ significantly from CVSS 3.1 rankings
- Framework adaptable to broader industrial applications
From the original article
1 min read at arxiv.orgThe integration of the Industrial Internet of Things (IIoT) into manufacturing has transformed industrial operations by optimising production management and ensuring product quality through smart industrial sensors that regulate processes based on real-time data. However, these sensor nodes are highly vulnerable to cyber threats, posing significant security risks that compromise their reliability and integrity.
By Sachin K. Sen · arxiv.org
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