Bad Likert Judge: A Novel Multi-Turn Technique to Jailbreak LLMs by Misusing Their Evaluation Capability
Unit 42 details the Bad Likert Judge multi-turn jailbreak that abuses LLMs' evaluation capability, raising attack success rates over 60% across six frontier models.
Palo Alto Networks Unit 42 describes the Bad Likert Judge technique, a multi-turn jailbreak that asks a target LLM to act as a Likert-scale judge scoring the harmfulness of example responses. The highest-rated example in each scale can carry harmful content, bypassing the model's internal guardrails. Testing across six state-of-the-art text-generation LLMs showed an average attack success rate increase of more than 60% versus plain attack prompts, with tested models anonymized. The technique targets edge cases rather than typical use, and the article positions the work as guidance for defenders on potential jailbreak risks.